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Document Details
Document Type
:
Article In Conference
Document Title
:
EBIC Contrast of Extended Defects: Theory, Experiment and Monte Carlo Simulations
تباين العيوب الممتدة الناتج عن التيار المحرض بحزمة الكترونية النظرية و التجربة و المحاكاة العددية
Subject
:
chemistry and geochemistry
Document Language
:
Arabic
Abstract
:
ABSTRACT. The Electron Beam Induced Current (EBIC) technique has been widely used to image the recombination activity of various extended defects including dislocations and grain bonndarics in semiconductors. In this paper, we deserioc a Moute Carlo algorithm thai we have developed 10 simulate the EBIC eontrast at a defect of arbitrary shape loeated underneath the Schottky contact. Then we discuss the results that wc have obtained for a dislocation perpcndieular to the surface.
Conference Name
:
the second saudi science confernce
Duration
:
From : 24محرم AH - To : 26محرم AH
From : 15مارس AD - To : 17مارس AD
Publishing Year
:
1425 AH
2004 AD
Number Of Pages
:
8
Article Type
:
Article
Added Date
:
Saturday, January 17, 2009
Researchers
Researcher Name (Arabic)
Researcher Name (English)
Researcher Type
Dr Grade
Email
محمد لضرع
LEDRA, N/A
Investigator
نوار ثابت
TABET, N/A
Researcher
natabet@kfupm.edu.sa
Files
File Name
Type
Description
39.pdf
pdf
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